Surface Science Lab
Surface Science Lab (SSL)
Lab Location
Boise State University
Boise, Idaho
Lab Director
Dr. Paul H. Davis
pauldavis2@boisestate.edu
Office: (208) 426-2091
Lab: (208) 426-5604
Expertise & Research
The following work can be done at the nano scale- nanoscale topographical mapping and surface roughness analysis; electrical, magnetic, and nanomechanical properties characterization and mapping; fluid imaging; nanoindentation, nanomanipulation, and nanolithography.
Available SPM modes include MFM (magnetic force microscopy), EFM (electric force microscopy) and KPFM (Kelvin probe force microscopy), CAFM/TUNA (conductive AFM/tunneling AFM), SCM (scanning capacitance microscopy), EC-AFM (electrochemical AFM) and SECM (scanning electrochemical microscopy), and PFM (piezoforce microscopy).
The above characterization techniques/modes (e.g., topography, electrical and magnetic properties, etc.) can be carried out in air, fluid, or an inert atmosphere.
Scheduling & Contracting Work
The client and the lab manager will first discuss the nature of the work. If it is a good is a good fit for the lab, a quote will be provided. The client will then work directly with the lab manager for scheduling and will be invoiced for the work after it is completed.
| Asset | Mfr and Model | Field | Application |
|---|---|---|---|
| Scanning Electron Microscope (SEM) | Tabletop Phenom | Materials Characterization | Materials characterization, qualitative elemental analysis |
| Nanomechanical / Nanoindentation System | Hysitron TS 75 Triboscope | Materials Characterization | Mechanical properties testing at nano-scale |
| Scanning Probe / Atomic Force Microscope (SPM / AFM) in Glovebox | Bruker Dimension Icon FastScan with Nanoscope V Controller housed in MBraun 3-glove glovebox | Materials Characterization | Sample topography; mechanical, electrical, and magnetic properties at nano-scale in a controlled inert atmosphere (Ar with <0.1 ppm O2 and H2O) |
| Scanning Probe / Atomic Force Microscope (SPM / AFM) | Bruker Dimension Icon FastScan Bio with Nanoscope V Controller | Materials Characterization | Sample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid |
| Scanning Probe / Atomic Force Microscope (SPM / AFM) | Bruker MultiMode 8 with Nanoscope V Controller | Materials Characterization | Sample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid |
| Scanning Probe / Atomic Force Microscope (SPM / AFM) | Bruker Dimension 3100 with Nanoscope IV Controller | Materials Characterization | Sample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid |