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Instrumentation

JEOL JEM-2100 HR Analytical Transmission Electron Microscope (TEM)

  • JEOL-2100CCD camera (Orius SC1000, Gatan)
  • Point resolution 0.23 nm
  • Line resolution 0.14 nm
  • STEM resolution 1.0 nm
  • EDS chemical analysis (Noran System 7, Thermo Scientific)
  • EELS chemical analysis, (Model 776 Enfina 1000, Gatan)
  • In-column annular dark field detector
  • Tomography unit for reconstruction of 3D images
  • In situ heating up to 1273 K (Gatan 652 double-tilt heating holder)
  • In situ cooling down to 77 K (Gatan 914 Cryo holder)
  • Magnetic imaging resolution 2.2 nm
  • Precession electron diffraction (DigiStar)
  • Automatic crystal orientation and phase mapping (ASTAR)
  • 3D diffraction tomography (ADT3D)

View SOP for TEM
View Application notes for TEM
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CAMECA SXFive Electron Microprobe (EPMA)

  • LaB6 source
  • Up to 30kV accelerating voltage
  • Up to 1uA beam current
  • Beam current stability within 0.2% per hour (20kV, 10nA)
  • Beam diameter of 100nm (20kV, 10nA)
  • Analytical resolution of 0.5um (10kV, 100nA)
  • Trace element detection limits <0.01wt%
  • 5 vertical WDS spectrometers
  • Large-area, high-sensitivity diffracting crystals (LPET, LTAP. LLIF, LPC0)
  • Analyze elements B-U
  • Integrated zoom optical microscope with reflected, transmitted and polarized light
  • Stage reproducibility within 1um
  • Backscatter electron detector (<0.1Z resolution)
  • Secondary electron detector
  • Stage and beam mapping
  • Line profiles
  • Quantitative and qualitative point and area analyses
  • Thermo Scientific UltraDry 10mm2 energy dispersive x-ray spectrometer

View Cameca SXFive Operating Instructions

View Application notes for EPMA

View current instrument status.

FEI Teneo Field Emission Scanning Electron Microscope (FESEM)

  • High vacuum or variable pressure operation
  • 30kV down to 20eV landing energy (with beam deceleration)
  • Up to 400nA beam current
  • Everhart-Thornley Secondary Electron Detector
  • Retractable Directional Backscatter Detector (annular and segmented)
  • Low Vacuum Secondary Electron Detector
  • In-lens Annular Backscatter Detector
  • In-column Secondary Electron Detector
  • Retractable STEM detector (bright field, dark field and HAADF, holds six samples)
  • Plasma Cleaner
  • Chamberscope
  • Navigational Camera
  • Large area image mapping and stitching
  • Oxford Instruments 80mm2 Energy+ (EDS)
  • Oxford Instruments AZtecHKL (EBSD)
  • Nabity NPGS electron beam lithography

View FEI Teneo Standard Operating Procedure

View Oxford Instruments AZtec Operating Procedure
View Application notes for FESEM
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Bruker AXS D8 Discover X-Ray Diffractometer

  • BrukerFor high-resolution determination of crystallographic structure, phase composition, and texture at ambient and high temperatures, this instrument includes:
  • Nickel filter
  • Göbel Mirror and Germanium primary monochromator
  • Non-ambient temperature stages (-180°C to 1600°C)
  • NaI(Tl) scintillation detector
  • Hi-Star area detector

View Application notes for Bruker AXS
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Bruker Tracer III SD hand-held XRF

  • XRF_TracerPeltier-cooled 10 mm2 SDD
  • Typical resolution: 145 eV at 100,000 cps
  • Vacuum pump attachment for enhanced light-element sensitivity
  • Gas-flow chamber for the measurement of gases down to Ne

View current instrument status for Tracer III SD.

Leica DM6000 M Materials Microscope

  • DM6000Fully motorized stage, objective and turrets
  • Bright field, dark field and DIC modes
  • 5 mega pixel digital image acquisition
  • LAS Montage MultiFocus module – Auto Z-stack image capture
  • LAS Power Mosaic module – Seamless mosaic image creation
  • Leica Map module – Surface geometry and texture analysis

View current instrument status for DM6000 M.