CAES Microscopy and Characterization Suite (MaCS)
Location
Center for Advanced Energy Studies (CAES)
Idaho Falls, Idaho
Lab Director
Dr. Yaqiao Wu
yaqiaowu@boisestate.edu
(208) 533-8112
Expertise & Research
MaCS has the capabilities to characterize a wide range of materials, including metals, semiconductors, ceramics, coal and minerals in bulk or powder forms, as well as some organic cellular materials. It can provide 2-D/3-D morphology, chemical information, and mechanical testing data from micron to atomic scale.
Scheduling & Contracting Work
Please contact the lab director to discuss work you would like done in this lab.
MaCS + AML Equipment Table
Use the search field to search for and filter content in this table.| Asset | Mfr and Model | Field | Application | Lab Name |
|---|---|---|---|---|
| Scanning Transmission Electron Microscope (STEM) | FEI Tecnai TF30-FEG STwin TEM with EDS, EELS (GIF), EFTEM & TopSpin | Materials characterization | Images materials structurally and chemically down to atomic scale | Microscopy and Characterization Suite (MaCS) |
| Local Electrode Atom Probe (LEAP) | Cameca LEAP 4000X HR | Materials characterization | Creates atomic mapping / imaging | Microscopy and Characterization Suite (MaCS) |
| Dual Beam Focused Ion Beam Microscope (FIB) – Scanning Electron Microscope (SEM) | FEI QUANTA 3D FEG with EDS & EBSD | Materials characterization | 2-D and 3-D materials characterization and analysis | Microscopy and Characterization Suite (MaCS) |
| Scanning Electron Microscope (SEM) | JEOL JSM 6610LV with EDS, EBSD, & CL | Materials characterization | Images material surfaces from micrometer to nanometer scale | Microscopy and Characterization Suite (MaCS) |
| Nano Indenter Atomic Force Microscope | Hysitron TI950 TriboIndenter | Materials characterization | Nano-mechanical test instrument for measuring the hardness and elastic modulus of materials, and imaging surface morphology down to atomic scale | Microscopy and Characterization Suite (MaCS) |
| X-Ray Diffractometer (XRD) | Rigaku SmartLab | Materials characterization | Phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. | Microscopy and Characterization Suite (MaCS) |
| Nanomill | Fishione 1040 | Materials characterization | TEM sample preparation | Microscopy and Characterization Suite (MaCS) |
| Ion Mill, Precision Ion Polishing System (PIPS) | Gatan PIPS II | Materials characterization | Sample preparation | Microscopy and Characterization Suite (MaCS) |
| Electrolyte Polisher | Fishione | Materials characterization | Sample preparation | Microscopy and Characterization Suite (MaCS) |
| Spark Plasma Sintering System (SPS) | Fuji Dr. Sinter | Materials characterization | Isostatic sintering of metallic or ceramic powders at very high (2000C) temperatures. | Advanced Materials Lab (AML) |
| Hi Temperature Furnace (2000 C) | Thermal Technology 1000-4560-FP20 | Materials characterization | Sample preparation, alloying of materials | Advanced Materials Lab (AML) |
| Automated Micro Indentation Hardness Tester | LECO LM247AT | Materials characterization | Sample preparation | Advanced Materials Lab (AML) |
| Non-Rad Glovebox | Custom | Materials characterization | Sample preparation of rad material | Advanced Materials Lab (AML) |
| Rad Glovebox | Custom | Materials characterization | Sample preparation | Advanced Materials Lab (AML) |
| Linear Sectioning Machine, Non-Rad | Leco MSX-205MZ | Materials characterization | Sample prep | Advanced Materials Lab |
| Polisher / Grinder, Rad | Beuhler Minimet 1000 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Polisher, Non-Rad | LECO Model: GPX-200 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Powder Press, 25 Ton | Carver AutoPellet Press (2) Inside Glovebox | Materials characterization | Sample preparation | Advanced Materials Lab |
| Grinder/Polisher , Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials Lab |
| Grinder/Polisher , Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials Lab |
| Hand Grinder | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Instron Shear Punch or Tensile Test | Mechanical Testing | Mechanical Properties | Advanced Materials Lab | |
| Saw, Rad | Buehler Isomet Low Speed Saw | Materials characterization | Sample preparation | Advanced Materials Lab |
| Mechanical Test Frame | Instron | Mechanical Testing | Mechanical Properties | Advanced Materials Lab |
| Vacuum Tube Furnace | CM Model 1730-12 HT | Materials characterization | Sample preparation | Advanced Materials Lab |
| Precision Etching and Coating System (PECS) | Gatan model 682 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Nano Indenter Atomic Force Microscope (AFM) | Hysitron TI-950 TriboIndenter | Materials characterization | Sample preparation | Advanced Materials Lab |
| Micro / Macro Hardness Testing | LECO AMH-Series | Materials characterization | Sample preparation | Advanced Materials Lab |
| Retsch Mill | Materials characterization | Sample preparation | Advanced Materials Lab | |
| Sample Mounting Press | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials Lab |
| Scanning Electron Microscope | JEOL 6610LV with EDS, EBSD, & CL | Materials characterization | Sample preparation | Advanced Materials Lab |
| Transmission Electron Microscope (TEM) | FEI Technai TF30-FEG STwin with EDS and EELS (GIF) | Materials characterization | Sample preparation | Advanced Materials Lab |
| Materials characterization | Sample preparation | Advanced Materials Lab | ||
| Vibratory Polisher | Buehler VibroMet 2 | Materials characterization | Sample preparation | Advanced Materials Lab |