University of Idaho
Dr. Thomas Williams
Materials analytical characterization
If you would like to see if this lab can assist you with your work, please contact that lab director.
|Asset||Mfr and Model||Field||Application|
|Field Emission Scanning Electron Microscope (FESEM)||Zeiss Supra 35 SEM (w/ Noran System 6 EDS)||Materials Characterization||Microstructural, structural and chemical microanaysis of materials (1 nm resolution)|
|Transmission Electron Microscopy||JEOL 2010J 200 kV Analytical TEM/STEM||Materials Characterization||Microstructural characterization in fine detail including defects like dislocations and EDS microanalysis (Angstrom-scale resolution)|