Surface Science Laboratory

Surface Science Lab Staff

Manager

Dr. Paul H. Davis (Materials Science & Engineering)

• Email:  pauldavis2@boisestate.edu
• Office:  (208) 426-2091
• Lab:  (208) 426-5604

Student Researchers (Current)

• Jesse Schimpf (Materials Science and Engineering)
• Olivia Maryon (Materials Science and Engineering)
• Sophia Mitchell (Materials Science and Engineering)
• Sam Ryan (Bishop Kelly High School)

Student Researchers (Recent Alumni)

• Kari Livingston Higginbotham (Mechanical and Biomedical Engineering)
• Corey Efaw (Mechanical and Biomedical Engineering)
• Jasen Nielsen (Mechanical and Biomedical Engineering)
• Katie Livingston Yocham (Mechanical and Biomedical Engineering)

Facilities & Equipment

The SSL consists of a 600 ft² lab specifically engineered to provide a constant temperature, low noise environment for optimal AFM and SEM operation.  Individual systems are located on isolated concrete slabs, and all 4 Bruker AFMs are situated atop vibration isolation tables and housed in acoustic dampening enclosures.  A Herzan VA-2 3-axis accelerometer (PDF) is available for characterizing and monitoring the vibrational noise spectrum.  More details regarding the SSL’s capabilities can be found in the SSL Brochure (PDF), and a recent quote regarding the SSL’s suite of Bruker AFMs can be found on the Bruker Surface Analysis website alongside testimonials from other high profile Bruker AFM users around the world.

Atomic Force Microscopy (AFM) or Scanning Probe Microscopy (SPM) Systems

• Bruker Dimension Icon FastScan Bio (PDF) SPM with 64 bit Nanoscope V Controller (PDF) housed in an MBraun controlled atmosphere (<1 ppm oxygen, <1 ppm water) 3-glove Labmaster glovebox.
  • Interchangeable Icon (PDF) and FastScan Bio (PDF) XYZ Closed Loop Scanners
  • Electrochemistry cell with heated sample chuck, CH Instruments 760E bipotentiostat, and Scanning Electrochemical Microscopy (SECM) (PDF) capabilities

• 

  Bruker Dimension Icon FastScan Bio (PDF) SPM with 64 bit Nanoscope V Controller (PDF)

  • Interchangeable Icon (PDF) and FastScan Bio (PDF) XYZ Closed Loop Scanners
  • 8″ Wafer and Multisample (PDF) Chucks
  • Dimension Heater/Cooler Accessory (PDF)
• Bruker MultiMode 8 (PDF) SPM with Nanoscope V Controller (PDF)
  • EVLR Vertical Engage Sealed Piezo Scanner (PDF) for Fluid Imaging (PDF)
  • PicoForce Closed Loop Z Scanner (PDF) for Force Spectroscopy
  • MultiMode Heater/Cooler Accessory (PDF)
• Bruker Dimension 3100 SPM (PDF) (formerly Digital Instruments/Veeco) with Nanoscope IV Controller
  • Hybrid XYZ Closed Loop Scanner (PDF)
  • 6″ Wafer Sample Chuck
  • DS83 Dimension Heater/Cooler Accessory (PDF)
• Hysitron TS 75 Triboscope Nanomechanical/Nanoindentation System for use with Dimension 3100 SPM (PDF)

Scanning Electron Microscopy (SEM) Systems

• Phenom Tabletop SEM

AFM/SPM Capabilities

• 

  Topography and Surface Roughness Analysis

  • PeakForce Tapping/Scan Asyst (PDF)
  • Noncontact Tapping
  • Tapping Mode (PDF)
  • Contact Mode
• Fluid Imaging (PDF)
• Electrical Characterization
  • Conductive AFM (CAFM) and Tunneling AFM (TUNA) (PDF)
  • Electrostatic Force Microscopy (EFM) (PDF) and Kelvin Probe Force Microscopy (KPFM) or Surface Potential (SP) Imaging (PDF)
  • Scanning Capacitance Microscopy (SCM) (PDF)
• Magnetic Properties Evaluation
  • Magnetic Force Microscopy (MFM) (PDF)
• Nanomechanical Properties Measurement
  • Quantitative Nanomechanical Mapping (PeakForce QNM) (PDF)
  • Force Volume (PDF)
  • Nanoindentation and Scratching (PDF)
• Frictional Forces Assessment
  • Lateral Force Microscopy (LFM) (PDF)
• Nanomanipulation and Nanolithography System (NanoMan) (PDF)
  • Nanomanipulation (Pushing)
  • Nanolithography (Scratching)