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Facilities & Equipment

MSMSE Shared Equipment Database

In addition to the equipment listed below that is available for use in the SSL, the Micron School of Materials Science & Engineering’s searchable shared equipment database can be found at:

Atomic Force Microscopy (AFM) or Scanning Probe Microscopy (SPM) Systems

Bruker Anasys nanoIR3-s with APE Carmina broadband laser

Environmentally Controlled Bruker Dimension Icon FastScan SPM with 64 bit Nanoscope V Controller 

Ambient Bruker Dimension Icon FastScan Bio SPM with 64 bit Nanoscope V Controller

Bruker MultiMode 8 SPM with Nanoscope V Controller

Bruker Dimension 3100 SPM with Hysitron TS 75 TriboScope Nanoindenter

Currently out of service.

Scanning Electron Microscopy (SEM) Systems

Phenom Tabletop SEM

Chris and Amber

Currently out of service.

AFM/SPM Capabilities

Chemical Identification

  • Photothermal AFM-IR
  • MIR s-SNOM

Electrochemical Experiments

  • Electrochemical AFM (EC-AFM)
  • Scanning Electrochemical Microscopy (SECM)

Fluid Imaging

Frictional Forces Assessment

  • Lateral Force Microscopy (LFM)

Magnetic Properties Evaluation

Nanomanipulation and Nanolithography System (NanoMan)

  • Nanomanipulation (Pushing)
  • Nanolithography (Scratching)

Thermal Properties

  • Nanothermal Analysis (Nano TA)
  • Scanning Thermal Microscopy (SThM)

Topography and Surface Roughness Analysis