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ECE Research Team Nabs Cover Feature

photograph of a gated field emitter array wafer section under test with the probe pin sitting on the die gate pad
The cover shows a photograph of a gated field emitter array wafer section under test with the probe pin sitting on the die gate pad.

ECE Professor Jim Browning and his research team, including Ranajoy Bhattacharya, Nedeljko Karaulac, Winston Chern, and Akintunde Ibitayo Akinwande, recently learned their article “Temperature Effects on Gated Silicon Field Emission Array Performance” would be published in the Journal of Vacuum Science and Technology.  Even more exciting, the team’s work has been selected as the cover feature for the March/April 2021 edition.