J.A. Woollam M-2000 Ellipsometer
Manufacturer: J.A. Woollam
Model: M-2000 Ellipsometer
The M-2000 is used to measure thin film thickness and optical constants. It is sensitive to less than a monolayer of material (sub-nm) on a surface and can determine thickness for transparent films up to tens of microns.
The M-2000 can also measure the optical constants (both n and k) from any type of material, whether dielectric,
organic, semiconductor, or metal.