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Dual Beam FIB/SEM Laboratory

Lab Location

University of Idaho
Moscow, Idaho

Lab Director

Dr. Suat Ay
(208) 885-2783


Materials characterization

Scheduling and Contracting Work

Please email to for possible work to be conducted in this lab.

FIB/SEM Home Page

AssetMfr and ModelFieldApplication
Dual Beam FIB-SEM FEI/Thermo SciosTM
dual-beam system (w/ EBSD Quasor and EDS (ultradry detector)
Materials Characterization and Sample PreparationTEM sample preparation, SEM imaging, compositional analysis, FIB integrated circuit edits, micro/nano deposition, patterning, etching, drilling etc.