Surface Science Lab

Surface Science Lab (SSL)

Lab Location

Boise State University
Boise, Idaho

Lab Director

Dr. Paul H. Davis
pauldavis2@boisestate.edu
Office: (208) 426-2091
Lab:  (208) 426-5604

Expertise & Research

The following work can be done at the nano scale- nanoscale topographical mapping and surface roughness analysis; electrical, magnetic, and nanomechanical properties characterization and mapping; fluid imaging; nanoindentation, nanomanipulation, and nanolithography.

Available SPM modes include MFM (magnetic force microscopy), EFM (electric force microscopy) and KPFM (Kelvin probe force microscopy), CAFM/TUNA (conductive AFM/tunneling AFM), SCM (scanning capacitance microscopy), EC-AFM (electrochemical AFM) and SECM (scanning electrochemical microscopy), and PFM (piezoforce microscopy).

The above characterization techniques/modes (e.g., topography, electrical and magnetic properties, etc.) can be carried out in air, fluid, or an inert atmosphere.

Scheduling & Contracting Work

The client and the lab manager will first discuss the nature of the work. If it is a good is a good fit for the lab, a quote will be provided. The client will then work directly with the lab manager for scheduling and will be invoiced for the work after it is completed.

SSL Home Page

AssetMfr and ModelFieldApplication
Scanning Electron Microscope (SEM)Tabletop PhenomMaterials CharacterizationMaterials characterization, qualitative elemental analysis
Nanomechanical / Nanoindentation SystemHysitron TS 75 TriboscopeMaterials CharacterizationMechanical properties testing at nano-scale
Scanning Probe / Atomic Force Microscope (SPM / AFM) in GloveboxBruker Dimension Icon FastScan with Nanoscope V Controller housed in MBraun 3-glove gloveboxMaterials CharacterizationSample topography; mechanical, electrical, and magnetic properties at nano-scale in a controlled inert atmosphere (Ar with <0.1 ppm O2 and H2O)
Scanning Probe / Atomic Force Microscope (SPM / AFM)Bruker Dimension Icon FastScan Bio with Nanoscope V ControllerMaterials CharacterizationSample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid
Scanning Probe / Atomic Force Microscope (SPM / AFM)Bruker MultiMode 8 with Nanoscope V ControllerMaterials CharacterizationSample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid
Scanning Probe / Atomic Force Microscope (SPM / AFM)Bruker Dimension 3100 with Nanoscope IV ControllerMaterials CharacterizationSample topography; mechanical, electrical, and magnetic properties at nano-scale under ambient conditions in air or fluid