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Electron and Optical Microscopy Equipment

JEOL JEM-2100 HR Analytical Transmission Electron Microscope (TEM)

  • JEOL-2100CCD camera (Orius SC1000, Gatan)
  • Point resolution 0.23 nm
  • Line resolution 0.14 nm
  • STEM resolution 1.0 nm
  • EDS chemical analysis (Noran System 7, Thermo Scientific)
  • EELS chemical analysis, (Model 776 Enfina 1000, Gatan)
  • In-column annular dark field detector
  • Tomography unit for reconstruction of 3D images
  • In situ heating up to 1273 K (Gatan 652 double-tilt heating holder)
  • In situ cooling down to 77 K (Gatan 914 Cryo holder)
  • Magnetic imaging resolution 2.2 nm
  • Precession electron diffraction (DigiStar)
  • Automatic crystal orientation and phase mapping (ASTAR)
  • 3D diffraction tomography (ADT3D)

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CAMECA SXFive Electron Microprobe (EPMA)

  • CAMECA SXFive Electron MicroprobeCeB6 source
  • Up to 30kV accelerating voltage
  • Up to 1uA beam current
  • Beam current stability within 0.2% per hour (20kV, 10nA)
  • Beam diameter of 100nm (20kV, 10nA)
  • Analytical resolution of 0.5um (10kV, 100nA)
  • Trace element detection limits <0.01wt%
  • 5 vertical WDS spectrometers
  • Large-area, high-sensitivity diffracting crystals (LPET, LTAP. LLIF, LPC0)
  • Analyze elements B-U
  • Integrated zoom optical microscope with reflected, transmitted and polarized light
  • Stage reproducibility within 1um
  • Backscatter electron detector (<0.1Z resolution)
  • Secondary electron detector
  • Stage and beam mapping
  • Line profiles
  • Quantitative and qualitative point and area analyses
  • Thermo Scientific UltraDry 10mm2 energy dispersive x-ray spectrometer

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FEI Teneo Field Emission Scanning Electron Microscope (FESEM)

Hitachi S-3400N-II Analytical Scanning Electron Microscope (SEM)

  • Resolution 3 nm (SEI) and 4 nm (BSI)Hitachi S-3400N-II Analytical Scanning Electron Microscope
  • Variable Pressure
  • Oxford Instruments Energy+ (EDS), resolution ≤ 136 eV at MnKa FWHM
  • Oxford Instruments INCAWave (WDS), resolution ≤ 10 eV
  • Oxford Instruments AZtecHKL (EBSD)
  • Samples up to 20 cm in diameter by 11 cm high

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Leica DM6000 M Materials Microscope

  • Fully motorized stage, objective and turretsDM6000
  • Bright field, dark field and DIC modes
  • 5 mega pixel digital image acquisition
  • LAS Montage MultiFocus module – Auto Z-stack image capture
  • LAS Power Mosaic module – Seamless mosaic image creation
  • Leica Map module – Surface geometry and texture analysis

View current instrument status for DM6000 M.