X-Ray and Electron Microscopy Lab
The X-Ray and Electron Microscopy Lab (XEML) hosts significant materials characterization capacity, with capabilities including TEM, SEM, XRD, optical microscopy and XRF. The lab also has sample preparation capabilities for optical and electron microscopy.
Location: Micron Engineering Center (MEC) 113
Contact: karthikchinnathambi@boisestate.edu or coreyefaw@boisestate.edu
The following table lists the XEML user fees.
Description | A | B | C |
---|---|---|---|
TEM | $90 | $128 | $200 |
FESEM (FEI Teneo) | $75 | $107 | $200 |
SEM (Hitachi) | $65 | $92 | $190 |
EPMA | $50 | $71 | $200 |
XRD (Bruker) | $50 | $71 | $125 |
XRD (Rigaku) per pattern | $40 | $57 | $100 |
XRF (per sample) | $20 | $29 | $100 |
Optical Microscopy | $15 | $22 | $50 |
Ion Beam Thinning | $15 | $22 | $75 |
Jet Polishing (per sample) | $5 | $8 | $25 |
Mechanical Grinding/Polishing | $15 | $22 | $50 |
Cutting | $10 | $15 | $50 |
Microtomy | $10 | $15 | $50 |
Dimple Grinding | $5 | $8 | $70 |
Ion Slicer (per sample) | $40 | $57 | $200 |
Technical Assistance | -- | $105 | $180 |