The JEOL T-300 scanning electron microscope housed in ERB-5119 acquires digital cathodoluminescence (CL) and back-scattered electron (BSE) images using SEMTech Solutions digital acquisition software, a Gatan MiniCL detector, and JEOL BSE detector. This vintage (ca 1984) instrument with manual stage manipulation, beam saturation, and image focusing is nonetheless very easy and inexpensive to maintain, optimize, and use, and rapidly yields excellent CL and BSU images at moderate (35-500x) magnification.
