SSL Facilities & Equipment

• Bruker Anasys nanoIR3-s with APE Carmina broadband laser source
  • Photothermal AFM-IR (~700 – 2,000 cm^-1) and IR s-SNOM (~700 – 4,000 cm^-1) capabilities
  • Nanoscale thermal analysis (NanoTA)
    • Transition Temperature Microscopy (TTM)
    • Scanning Thermal Microscopy (SThM)

• Bruker Dimension Icon FastScan Bio SPM with 64 bit Nanoscope V Controller housed in an MBraun controlled atmosphere (<1 ppm oxygen, <1 ppm water) 3-glove Labmaster glovebox.
• Interchangeable Icon and FastScan Bio XYZ Closed Loop Scanners
• Electrochemistry cell with heated sample chuck, CH Instruments 760E bipotentiostat, and Scanning ElectrochemicalMicroscopy (SECM) capabilities

• Interchangeable Icon and FastScan Bio XYZ Closed Loop Scanners
• 8″ Wafer, Multisample, Bio, and EC-AFM Chucks
• Dimension Heater/Cooler Accessory

• Bruker MultiMode 8 SPM with Nanoscope V Controller
• EVLR Vertical Engage Sealed Piezo Scanner for Fluid Imaging
• PicoForce Closed Loop Z Scanner for Force Spectroscopy
• MultiMode Heater/Cooler Accessory

Currently out of service.

Currently out of service.

• Photothermal AFM-IR
• MIR s-SNOM

• Conductive AFM (CAFM) and Tunneling AFM (TUNA)
• Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KPFM) or Surface Potential (SP) Imaging
• Scanning Capacitance Microscopy (SCM)

• Electrochemical AFM (EC-AFM)
• Scanning Electrochemical Microscopy (SECM)

• Fluid Imaging

• Lateral Force Microscopy (LFM)

• Magnetic Force Microscopy (MFM)

• Nanomanipulation (Pushing)
• Nanolithography (Scratching)

• Force Volume
• Nanoindentation and Scratching
• Quantitative Nanomechanical Mapping (PeakForce QNM)

• Nanothermal Analysis (Nano TA)
• Scanning Thermal Microscopy (SThM)

• Contact Mode
• Tapping Mode
  • Noncontact Tapping
• PeakForce Tapping/Scan Asyst